Test items ※ SEM observation of fracture + EDS microanalysis in contamination analysis: observation of surface topography metals, plastics, ceramics and other solid materials as well as measurement of small size. Analysis of the type of solid surface micro elements contained in the content of each element and the relative content of each element in a specific area of ??distribution. ※ surface composition + depth GD-OES analysis: both can be matrix component analysis, such as cemented carbide material, can also be surface components - the depth of analysis, such as thin film PVD, plating, heat treatment hardened layer, coating layer, the anodized film surface technology and chemical analysis film. ※ Process Quality Defect Analysis SEM / EDS? Function: microscopic morphology, small size measurement, micro-component analysis Magnification:? 5 times to 30 times the resolution detector:?? 133eV range of elements can be analyzed: Be ( 4) ~ U (92) glow discharge spectrometer (GD-OES) function:?? base component testing, surface composition - depth analysis features: available product surface composition with depth profile depth range: 10nm ~ 150μm?? composition range: 10ppm ~ 100%